src_e53adb99e40ae66258
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- Oct 07, 2026 01:24 UTC
- Retrieved
- Oct 08, 2026 03:46 UTC
ePrint Report: Rare-Event Decorrelation for Linear Tests of Low-Complexity Pseudorandom Functions Nikolas Melissaris Linear tests are a basic obstacle to pseudorandom functions built from low-depth circuits and secret linear or affine maps. Ball, Ducros, Erabelli, Kohl, Resch, and Scholl left open whether their bounded-query strong-PRF candidate in $\mathrm{AC}^0[2]$ resists general non-adaptive l
Rare-Event Decorrelation for Linear Tests of Low-Complexity Pseudorandom Functions48594e7e3f9a1148f6a5b4582704f839eff8aa90eb0d0ddd133082d83cdca03fNetwork indicators are visibly defanged. This page does not make them clickable or send them to another service.
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